Operation management in a memory device

ABSTRACT

Methods of operating a memory device include performing a first memory operation having an associated timing requirement; after completing the first memory operation, determining whether a timing margin between completion of the first memory operation and expiration of its associated timing requirement exceeds a length of time to perform a particular portion of a second memory operation; and performing the particular portion of the second memory operation between completion of the first memory operation and the expiration of its associated timing requirement if it is determined that the timing margin between completion of the first memory operation and expiration of its associated timing requirement exceeds the length of time to perform the particular portion of the second memory operation.

RELATED APPLICATION

This application is a Continuation of U.S. application Ser. No.13/930,715, titled “OPERATION MANAGEMENT IN A MEMORY DEVICE,” filed Jun.28, 2013, (allowed) which is commonly assigned and incorporated hereinby reference.

TECHNICAL FIELD

The present disclosure relates generally to memory and in particular, inone or more embodiments, the present disclosure relates to management ofoperations in memory devices.

BACKGROUND

Memory devices are typically provided as internal, semiconductor,integrated circuits in computers or other electronic systems. There aremany different types of memory including random-access memory (RAM),read only memory (ROM), dynamic random access memory (DRAM), synchronousdynamic random access memory (SDRAM), resistive random access memory(RRAM), double data rate memory (DDR), low power double data rate memory(LPDDR), phase change memory (PCM) and Flash memory.

Non-volatile memory is memory that can retain its stored data for someextended period without the application of power. Flash memory deviceshave developed into a popular source of non-volatile memory for a widerange of electronic applications. Flash memory devices are commonly usedin electronic systems, such as personal computers, personal digitalassistants (PDAs), digital cameras, digital media players, digitalrecorders, games, appliances, vehicles, wireless devices, cellulartelephones, and removable memory modules, and the uses for Flash memorycontinue to expand.

Many memory devices, such as commonly included in some electronicsystems, perform various operations to manage the operation of thememory device. Memory devices typically perform memory operations suchas reading, writing and erasing operations. These operations aresometimes referred to as foreground operations as these operations aresometimes initiated by a memory access device, such as a processor, orother memory device control circuitry coupled to the memory device.Additional operations include what are sometimes referred to asbackground operations. These operations are sometimes initiated bycontrol circuitry in a memory device itself. Wear-leveling in memorydevices might be performed as a background operation, for example.Wear-leveling operations might be performed to distribute memory erasecycles across a memory array of a memory device in an effort to improvereliability. As the demand for higher operating speeds in memory devicescontinue to increase, violation of timing requirements of memory devicesmay occur as a result of performing one or more of these backgroundoperations.

For the reasons stated above, and for other reasons stated below whichwill become apparent to those skilled in the art upon reading andunderstanding the present specification, there is a need in the art formitigating violating memory device timing requirements as a result ofperforming operations, such as background operations, in memory devices.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a simplified block diagram of a memory device coupled to amemory access device as part of an electronic system.

FIG. 2 is a timing diagram of memory operations in a memory device.

FIG. 3 is a simplified block diagram representative of a segmentedoperation according to an embodiment of the present disclosure.

FIG. 4 illustrates a graphical representation of determining segmentsmargins of memory operations according to an embodiment of the presentdisclosure.

FIG. 5 is a timing diagram of memory operations according to anembodiment of the present disclosure.

FIG. 6 illustrates a block diagram of a state tracker according to anembodiment of the present disclosure.

FIG. 7 is a flowchart illustrating a method of performing a segmentedoperation according to an embodiment of the present disclosure.

FIG. 8 illustrates a functional block diagram of a memory device coupledto a memory access device as part of an electronic system according toan embodiment of the present disclosure.

DETAILED DESCRIPTION

In the following detailed description of the invention, reference ismade to the accompanying drawings that form a part hereof, and in whichis shown, by way of illustration, specific embodiments. In the drawings,like numerals describe substantially similar components throughout theseveral views. Other embodiments may be utilized and structural,logical, and electrical changes may be made without departing from thescope of the present disclosure. The following detailed description is,therefore, not to be taken in a limiting sense.

FIG. 1 illustrates a simplified block diagram of a memory device 102coupled to a memory access device 104 as part of an electronic system100. The memory access device 104 might be a processor or some othertype of control circuitry. The memory device 102 is coupled to theprocessor 104 over one or more communications channels 106 (e.g.,communications bus.) The communications bus might comprise command,address and/or data signal lines. The communications bus might comprisea number of standard interfaces, such as a Universal Serial Bus (USB)interface, for example. The communications bus might be a standardinterface used with many hard disk drives (e.g., SATA, PATA) as areknown to those skilled in the art. Together, the memory device 102,memory access device 104 and the communications bus 106 form part of theelectronic system 100.

Memory device 102 further comprises a memory array 110, such ascomprising an array of memory cells, for example. Memory deviceoperations to be performed on the memory array 110 are facilitated bymemory array control circuitry 112. The processor 104 might transfer oneor more commands to the memory device 102 via the communications bus toperform an operation on the memory array 110, such as a read, write(e.g., programming) and/or erase operation. These operations aresometimes referred to as foreground operations as they may be performedresponsive to a specific command received from the processor 104, forexample.

Memory array 110 might comprise one or more types of memory, such as anarray of Flash memory cells, for example. Flash memory typicallyutilizes one of two basic architectures known as NOR Flash and NANDFlash. The designation is derived from the logic used to read thedevices. In NOR Flash architecture, a logical column of memory cells iscoupled in parallel with each memory cell coupled to a data line, suchas those typically referred to as digit (e.g., bit) lines. In NAND Flasharchitecture, a column of memory cells is coupled in series with onlythe first memory cell of the column coupled to a bit line. Control gatesof memory cells comprising a row of memory cells are coupled to accesslines, such as those typically referred to as word lines.

In a typical Flash memory array, each selected memory cell isindividually programmed as either a single level cell (SLC) or amultiple level cell (MLC). The cell's threshold voltage (V_(t)) can beused as an indication of the data stored in the cell. For example, in anSLC, a V_(t) of 2.5V might indicate a programmed cell while a V_(t) of−0.5V might indicate an erased cell. An MLC uses multiple V_(t) rangesthat each indicates a different state. Multiple level cells can takeadvantage of the analog nature of a traditional charge storage cell byassigning a bit pattern to a specific V_(t) range.

Programming Flash memory cells typically involves applying one or moreprogramming pulses (Vpgm) to a selected word line coupled to one or moreselected memory cells. Typical programming pulses (Vpgm) start at ornear 15V and tend to increase in magnitude with each programming pulseapplication. During a programming operation, a potential, such as aground potential (e.g., 0V), is applied to the substrate of the array,and thus to the channels of the selected memory cells. This results in acharge transfer from the channel to the charge storage structures ofmemory cells selected for programming. For example, floating gates aretypically charged through direct injection or Fowler-Nordheim tunnelingof electrons from the channel to the floating gate, resulting in a V_(t)typically greater than zero in a programmed state. Performing a sense(e.g., read) operation on one or more selected memory cells of thememory array typically requires applying voltages to the selected memorycells which are typically at or below Vcc, such as 3V, for example.

Memory array 110 might comprise an array of phase change memory (PCM.)PCM is a resistive memory technology that can provide non-volatilestorage but has the potential of relatively faster operation compared toflash memory. PCM, as the name implies, uses the change in resistance ofa material when it changes phase in order to store data in anon-volatile manner. For example, an alloy of different elements mightchange from a crystalline phase having a low resistance to an amorphousphase having a high resistance. When the material exhibits multipledistinctly different resistances, each different resistance can beassigned a respective data value (e.g., 00, 01, 10, 11).

Memory array 110 might comprise other types of memory such as a dynamicrandom access memory (DRAM), a synchronous dynamic random access memory(SDRAM), resistive random access memory (RRAM), a double data ratememory (DDR) and/or low power double data rate memory (LPDDR), forexample. Memory device 102 might comprise more than one type of memory,such as a combination of volatile and non-volatile memory, for example.

FIG. 2 illustrates a timing diagram 200 for a number of memoryoperations, such as including foreground and background operations,performed in a memory device. For an example illustrated by FIG. 2, atime frame specified for the memory device to perform a completeforeground operation, such as an erase operation, might be indicated atline 202. A time frame might comprise a time frame assigned (e.g.,assigned as a timing requirement) to a particular foreground operation.The memory device should complete the particular foreground operationwithin the time frame (e.g., meet the timing requirement) after thememory device has been commanded to perform the operation, such as by aprocessor, for example. Bar 204 is illustrative of a duration of time toperform an erase operation in the memory device, such as a flash memorydevice, for example. It can be seen from FIG. 2 that the time to performthe erase operation 204 is within the time frame 202. Bar 206illustrates a duration for performing an erase operation, such asindicated by bar 204, and another operation, such as a particularbackground operation. It can be seen that the duration of the eraseoperation and the particular background operation as represented by bar206 is within the time frame 202.

Bar 208 illustrates a duration to complete an erase operation andperform a different background operation than represented by bar 206,such as performing an erase operation and a wear-leveling operation inthe memory device, for example. It can be seen from bar 208 that thetime frame 202 has been exceeded by performing the erase operation and acomplete wear-leveling operation. The time to perform the eraseoperation corresponding to bar 208 might be indicated by line 210whereas the time between line 210 and 212 might correspond to the timeto complete the wear-leveling operation, for example. Thus, the durationof performing the erase operation and a wear-leveling operation 212violates a timing requirement for the memory device.

FIG. 3 illustrates a simplified block diagram 300 representative of asegmented operation (e.g., segmented background operation) 302 accordingto various embodiments of the present disclosure. As discussed above,performing multiple operations, such as the erase operation and thewear-leveling operation associated with bar 208 of FIG. 2, violated atiming requirement for the memory device. FIG. 3 illustrates that anoperation 302, such as a background operation, might be divided (e.g.,segmented) into a number of N segments. For example, it might bedetermined that a wear-leveling operation be segmented into a number ofportions, such as into segments SEGMENT1-SEGMENTN 304-310. The length ofeach segment is determined wherein at least one segment of the segmentedoperation might be performed along with another operation, such as anerase operation, and not violate a particular timing requirement of thememory device.

FIG. 4 illustrates a graphical representation 400 of how segment lengthsmight be determined for one or more operations (e.g., backgroundoperations) according to various embodiments of the present disclosure.Time frames for different memory operations, such as read, write and/orerase operations, might be defined (e.g., defined as timingrequirements) and vary for memory devices. The time frame 406 (e.g.,maximum time duration) to complete an operation might comprise aduration 402 (e.g., time frame) as indicated between lines T0 404 and T2406. The time frame to perform an operation, such as an erase operation,is determined and is indicated by arrow 408 between lines T0 404 and T1410.

The erase operation duration represented by arrow 408 might bedetermined by various methods. The duration of the erase operation 408might comprise an estimated or averaged time duration, for example. Theerase operation duration 408 might be experimentally determined byperforming a number of erase operations in a representative memorydevice and measuring a duration to complete each erase operation. Aworst case measurement might be used as the erase operation duration408, for example. Alternatively, an average of the measured erase timesor some other type of algorithm might be used to determine the eraseoperation duration 408. The erase operation duration determination mightfurther depend on various factors, such as the amount of memoryundergoing an erase operation, for example.

The difference between the determined erase operation duration 408(e.g., T1-T0) indicated at line T1 410 and the time frame indicated atline T2 406 might be referred to as a segment margin 412 (e.g., T2-T1).A segment length (e.g., maximum segment length) for segmenting aparticular background operation might be assigned to be less than orequal to the segment margin 412 according to one or more embodiments ofthe present disclosure. Thus, one or more segments of various backgroundoperations might be performed (e.g., executed) within one or moremargins (e.g., segment margins 412) of a foreground operation withoutviolating a timing requirement corresponding to the foregroundoperation.

According to one or more embodiments, it might be desirable to perform awear-leveling operation utilizing the time between the completion of anerase operation 410 and the expiration of a time frame for the eraseoperation 406 in a memory device, such as (T2-T1) as shown in FIG. 4,for example. The wear-leveling operation might be segmented into aplurality of segments where each segment length of the segmentedwear-leveling operation is less than or equal to the segment margin 412shown in FIG. 4. Thus, one or more segments of the segmentedwear-leveling operation might be performed following each of a pluralityof erase operations until each segment of the segmented wear-levelingoperation is complete and without violating a timing requirement of thememory device.

FIG. 5 illustrates a timing diagram of a plurality of foregroundoperations MEMORY OP1-MEMORY OP4 504-510 performed along with asegmented background operation comprising SEGMENT1-SEGMENT4 512-518according to various embodiments of the present disclosure. Foregroundoperations 504-510 might comprise the same type of operation or mightcomprise a combination of different operations. Foreground operations504-510 might comprise reading, writing and/or erasing operations, forexample. One or more of foreground operations 504-510 might compriseoperations performed such as part of a reset sequence, such as followingthe application of power to the memory device, for example. Line 502 isrepresentative of a memory device time frame corresponding to one ormore foreground operations. Although one time frame 502 is shown in FIG.5, different time frames might be associated with different foregroundoperations according to various embodiments of the present disclosure.For example, a time frame corresponding to an erase operation might bedifferent than a time frame corresponding to read and/or a writeoperation.

Each foreground operation 504-510 might be initiated in the memorydevice responsive to a corresponding command CMD1-CMD4 520-526 receivedfrom a processor coupled to the memory device, for example. Although theforeground operations 504-510 are shown on the same scale (e.g., timescale), each operation might be performed and the expiration of thecorresponding time frame might occur prior to initiating a nextoperation. For example, a processor might transfer CMD1 520 to thememory device where foreground operation MEMORY OP1 504 is completed andafter the expiration of the corresponding time frame 502 the processortransfers CMD2 522 to initiate operation MEMORY OP2 506, for example.Thus, the processor sends a next command following (e.g., subsequent to)the expiration of the time frame 502 corresponding to a previouslytransferred command. The time scale shown in FIG. 5 is intended to beillustrative and not limiting.

According to one or more embodiments, MEMORY OP1-MEMORY OP4 504-510might be representative of four erase operations performed in a memorydevice. A processor coupled to the memory device might transfer a firsterase command CMD1 520 to the memory device to perform a first eraseoperation MEMORY OP1 504. Upon expiration of the time frame 502corresponding to the first erase operation 504, the processor mighttransfer a second erase command CMD2 522 to the memory device to performa second erase operation 506, and so on. Various embodiments takeadvantage of the time between completing a foreground operation and theexpiration of the corresponding time frame 502, such as indicated by thearrow 530, for example. One or more operation segments might beperformed within these remaining timing margins 530 and thus facilitatemitigating timing requirement violations in the memory device.

By way of example, it might be desirable to perform a wear-levelingoperation in addition to performing erase operations in a memory device.As discussed above with respect to FIG. 2, performing an erase operationalong with a complete wear-leveling operation will violate an erasetiming requirement of the memory device. Various embodiments facilitatesegmenting a background operation, such as a wear-leveling operation asdiscussed above with respect to FIG. 3, to avoid violating one or moretiming requirements of the memory device. One or more of these segmentsof the segmented wear-leveling operation might be performed in thetiming margin between completing each erase operation and the expirationof the corresponding time frame for each erase operation. Thus, theperformance of the segmented wear-leveling operation might be “hidden”from the processor as these segments are performed in the timing marginsbetween the completion of a foreground operation, such as an eraseoperation, and the expiration of the respective time frame of theforeground operation.

Determining the length of SEGMENT1-SEGMENT4 512-518 comprising thewear-leveling operation might be made such as discussed above withrespect to FIGS. 3 and 4. For example, a worst case duration to completean erase operation might be determined. The segment length ofSEGMENT1-SEGMENT4 512-518 is assigned responsive to the determinedsegment margin, such as segment margin 412 discussed above and shown inFIG. 4.

Referring again to FIG. 5, a processor might transfer a command CMD1 520to a memory device configured to facilitate segmenting one or moreoperations according to various embodiments of the present disclosure.The transferred command CMD1 520 might comprise a read command to beperformed in the memory device. The memory device might perform the readoperation (e.g., MEMORY OP1 504) in response to the received command.Control circuitry in the memory device might be configured to performSEGMENT1 512 subsequent to completion of the read operation MEMORY OP1504. As the length of SEGMENT1 512 has been assigned to be less than adetermined worst case duration of a read operation, SEGMENT1 512 can beperformed prior to the expiration of the time frame 502. At some timeafter the expiration of the time frame 502 associated with MEMORY OP1504, the processor might transfer CMD2 522 to the memory device toperform a write operation MEMORY OP2 506 in the memory device. Followingcompletion of the write operation MEMORY OP2 506, control circuitry inthe memory device facilitates performing the next segment SEGMENT2 514comprising the segmented wear-leveling operation.

Performance of SEGMENT3 516 and SEGMENT4 518 is facilitated responsiveto the processor transferring CMD3 524 and CMD4 526 to initiate MEMORYOP3 508 and MEMORY OP4 510, respectively. CMD3 524 and CMD4 526 mightcomprise a combination of read, write and/or erase commands, forexample. Thus, the segmented wear-leveling operation according to one ormore embodiments has been completed by performing segmentsSEGMENT1-SEGMENT4 512-518 within the timing margin between thecompletion of each operation MEMORY OP1-MEMORY OP4 504-510 and theexpiration of their respective time frames 502. Thus, backgroundoperations which might violate one or more timing requirements of thememory device if completely performed in response to completing aforeground operation might be segmented and performed in order tofacilitate a reduction in violating one or more timing requirements ofthe memory device.

As discussed above, different segment margins might be determinedcorresponding to different operations according to various embodimentsof the present disclosure. A segment margin corresponding to a readoperation might be different than a segment margin corresponding to awrite and/or an erase segment margin, for example. Thus, one or moreoperations might be divided into segments wherein each segment has alength which is less than or equal to a particular determined segmentmargin. One or more segments of an operation might be performed during afirst time frame so as not to violate a particular timing requirement.During another time frame (e.g., subsequent to the first time frame) oneor more remaining segments of the particular operation might beperformed. This may be repeated until each segment of the segmentedoperation has been performed. This facilitates performing one or moresegments of a segmented background operation in response to completing aforeground operation and within a corresponding time frame assigned toperform the foreground operation so as to mitigate the occurrence oftiming requirement violations in the memory device. Thus, according toone or more embodiments, one or more segments might be performed in thetime remaining from when the foreground operation is complete to whenthe time frame assigned to perform the foreground operation has elapsed.It should be noted that various embodiments are not limited tosegmenting wear-leveling operations. Other operations, such asforeground and/or background operations, might be segmented. Variousembodiments are not limited to performing one or more segmentscomprising a segmented operation following only an erase operation.

Various embodiments according to the present disclosure provide statetrackers (e.g., non-volatile state trackers) to facilitate maintaining astate of each segment of the plurality of segments of each segmentedoperation. As illustrated by an example, a memory device mightexperience an event which can interrupt the performance of one or moresegments comprising a segmented operation according to variousembodiments of the present disclosure. A reset of the memory devicemight occur such as part of a system reset or power cycle eventoccurring in the memory device, for example. A wear-leveling operationmight be corrupted during one of these events such as a system reset,for example. Without the non-volatile state trackers the states of theperformance of the plurality of segments, such as which segments mighthave been initiated, partially performed or completed, might be lost inthe event of interrupting the operation of the memory device, forexample.

FIG. 6 illustrates a graphical representation of a segmented operation(e.g., multiple segment operation) 602 and a corresponding non-volatilestate tracker 604 according to an embodiment of the present disclosure.The state tracker 604 is arranged to store a plurality of statesSTATE1-STATEN, where each state (e.g., state value) corresponds 606 to aparticular segment of the corresponding multiple segment (e.g.,multi-segment) operation 602. The state tracker 604 comprising the statevalues might be stored in a location of memory of the memory device,such as in a non-volatile memory location, for example. Each state, suchas STATE1-STATEN of the state tracker 604, might comprise a single bit(e.g., milestone bit) corresponding to a segment of the correspondingmulti-segment operation 602. A particular bit value might be associatedwith a particular state of the corresponding operation segment. Forexample, a bit value of ‘0’ might be indicative of an operation segmentthat has not yet been completed, whereas a bit value of ‘1’ might beindicative of an operation segment which has been completed, or viceversa, for example. According to one or more embodiments, each state ofthe state tracker 604 might comprise a plurality of bits indicative ofone or more states of the corresponding operation segment. For example,a state value might comprise a value corresponding to a ‘segmentuninitiated state,’ a ‘segment initiated state’ or a ‘segment completedstate’ according to various embodiments of the present disclosure. Thenon-volatile nature of the memory location storing the state trackerfacilitates retaining each state value of the state tracker even ifpower should be removed from the memory device, for example.

A memory device according to one or more embodiments might comprise anaddress remapping unit which facilitates logical to physical addresstranslation, sometimes referred to as logical to physical addressmapping, in the memory device. A one to one mapped device might beconsidered to comprise one physical sector of memory to correspond toone logical sector of memory, for example. To prevent corruption of theone or more state trackers stored in the memory device, one or morelogical addresses (e.g., range of logical addresses) corresponding toone or more physical addresses storing the state trackers might beblocked from access except by the memory device control circuitryconfigured to manage each state tracker. Thus, one or more embodimentsfacilitate managing access, such as allowing or blocking access, to oneor more logical addresses mapped to physical addresses configured tostore one or more state trackers corresponding to one or moremulti-segment operations. For example, control circuitry of the memorydevice might have access to physical addresses in memory storing statetrackers but a processor coupled to the memory device might not beallowed access.

FIG. 7 illustrates a flowchart 700 of performing at least a portion of amultiple segment operation and updating a corresponding state tracker(e.g., non-volatile state tracker) according to various embodiments ofthe present disclosure. Control circuitry of the memory device mightmake a determination 706 whether to service the multiple segmentoperation following another operation 702, such as a foregroundoperation, within a time frame corresponding to (e.g., assigned toperform) the foreground operation. A foreground operation might beperformed 702, such as a foreground operation 504-510 performed asdiscussed above with respect to FIG. 5, for example.

The determination 706 by the control circuitry of the memory device toservice the multiple segment operation might be made responsive tovarious events. A determination might be made responsive to a reset ofthe memory device, such as following a power cycle of the memory device.A determination 706 might be made responsive to a received command, suchas from a processor, to perform a particular foreground operation 702 inthe memory device. For example, a processor might transfer a command tothe memory device to perform a foreground operation 702 (e.g., eraseoperation) in the memory device. The control circuitry might make adetermination 706 if a segment length of one or more segmentedbackground operation segments is less than or equal to a segment margin,such as discussed above with respect to FIG. 4, corresponding to theerase operation to be performed. If it is determined that sufficientmargin exists to perform both the erase operation and at least oneoperation segment within the time frame for the erase operation, thecontrol circuitry might make a determination to perform 708 at least oneoperation segment along with the erase operation. If it is determinedthat there is insufficient margin (e.g., insufficient time between anend of performing the foreground erase operation and the end of the timeframe assigned to perform the erase operation) to perform a particularoperation segment, then the control circuitry might make a determinationto inhibit performing 704 a segment of one or more multiple segmentoperations within the time frame for the erase operation. Upon receiptof another command from the processor to perform a foreground operation702 in the memory device, the control circuitry might repeat thedetermination 706 whether to perform an operation segment 708 or not toperform an operation segment 704 along with the next foregroundoperation to be performed.

Upon determination to service a multiple segment operation and performan operation segment 708, the control circuitry reads 710 one or morestates of the state tracker corresponding to segments of the multiplesegment operation to be serviced. The states of the state tracker 604indicate the status of each segment the multiple segment operation to beservice. For example, one or more status bits of the states comprisingthe corresponding state tracker, such as 604 shown in FIG. 6, are readto determine the status of the state tracker. A particular segment ofthe multiple segment operation might be performed 714 responsive to thedetermination of the status of the multiple segment operation 712. Thestate tracker is updated 716 responsive to performing a segment 714 ofthe multiple segment operation. The state tracker might be updated 716by performing a write operation in the memory location storing the statetracker according to one or more embodiments of the present disclosure.The method illustrated by FIG. 7 (e.g., 702-716) might be repeated untila particular multiple segment background operation has been completed.For example, a particular block of memory of a memory array of a memorydevice might be identified for wear-leveling. According to variousembodiments, segments comprising a multiple segmented wear-levelingoperation might be performed as discussed with respect to FIG. 7 untilthe complete wear-leveling operation has been performed on the entireidentified block of memory. This is in contrast to what is sometimesreferred to as a suspend operation in a memory device. A suspendoperation merely pauses an operation, such as in response to aninterrupt occurring in the memory device, which might be resumed at alater time. Should an event such as a reset occur in the memory device,evidence of the suspended operation would be lost.

According to various embodiments, a portion of the method illustrated byFIG. 7 (e.g., 706-716) might be repeated a number of iterationsresponsive to how many segments might be performed within a segmentmargin corresponding to the performed foreground operation 702. Forexample, the control circuitry might determine that sufficient marginexists between an end of the foreground operation 702 and an end of thetime frame assigned to perform the foreground operation so as to performa plurality of segments within the same segment margin. According to oneor more embodiments, a timer circuit of a memory device might facilitatedetermining the segment margin (e.g., remaining time between an end ofthe foreground operation and the end of the time frame assigned toperform the foreground operation) to determine if one or more segmentsmight be performed subsequent to completing the foreground operation andprior to or concurrent with the end of the time frame assigned toperform the foreground operation, for example.

FIG. 8 is a functional block diagram of an electronic system having atleast one apparatus, such as a memory device 800, according to one ormore embodiments of the present disclosure. As used herein, an‘apparatus’ can refer to, but is not limited to, an array, circuitry, adevice or devices, a semiconductor die or dies, a module or modulesand/or a system or systems, for example. The memory device 800illustrated in FIG. 8 is coupled to a memory access device, such as aprocessor 810. The processor 810 may be a microprocessor or some othertype of control circuitry. The memory device 800 and the processor 810form part of an electronic system 820. The memory device 800 has beensimplified to focus on features of the memory device that are helpful inunderstanding various embodiments of the present disclosure.

The memory device 800 includes one or more memory arrays 830 that mightbe logically arranged in rows and columns. The one or more memory arrays830 might comprise 2D and/or 3D memory arrays. The memory array 830might include multiple banks and blocks of memory cells residing on asingle or multiple die as part of the memory device 800. Memory array830 might comprise SLC and/or MLC memory. The memory array 830 mightalso be adaptable to store varying densities (e.g., MLC(four-level) andMLC(eight-level)) of data in each memory cell, for example.

Memory array 830 might comprise memory such as flash memory and/or PCMmemory. Memory array 830 might comprise other types of memory such as adynamic random access memory (DRAM), a synchronous dynamic random accessmemory (SDRAM), resistive random access memory (RRAM), a double datarate memory (DDR) and/or low power double data rate memory (LPDDR), forexample. Memory device 800 might comprise more than one type of memory,such as a combination of volatile and non-volatile memory, for example.

A state tracker 832 corresponding to a multiple segment operationaccording to one or more embodiments might be stored in a non-volatilelocation in the memory array 830. The state tracker 832 might comprise anumber of locations 834 to store states STATE1-STATEN where each statecorresponds to a particular segment of a multiple segment operation,such as described above with respect to FIG. 6, for example. To reducethe risk of corrupting the state values of the state tracker 832, one ormore logical addresses corresponding to the state tracker location mightbe blocked from access other than by control circuitry 870 of the memorydevice 800 according to various embodiments of the present disclosure.

The memory device 800 reads data in the memory array 830 by sensingvoltage or current changes in the memory array columns using sensedevices, such as sense/data cache circuitry 848. The sense/data cachecircuitry 848, in at least one embodiment, is coupled to read and latcha row of data from the memory array 830. The sense/data cache circuitry848 might comprise driver circuitry to bias bit lines to variouspotentials, for example. Input and output (I/O) buffer circuitry 860 isincluded for bi-directional communication over a communications channel(e.g., I/O bus) 862 with the processor 810. Address and/or data signalsmight be transferred over the I/O bus between the memory device 800 andthe processor 810. An address buffer circuit 840 is provided to latchaddress signals provided from the I/O circuitry 860. Address signals arereceived and decoded by a row decoder 844 and a column decoder 848 toaccess the memory array 830. Row decoder 844 might comprise drivercircuitry configured to bias word lines of the memory array 830.Write/erase circuitry 856 is provided to write data to and/or erase datafrom the memory array 830.

Control circuitry 870 is configured, at least in part, to facilitateimplementing various embodiments of the present disclosure. For example,control circuitry 870 might be configured to facilitate performing themethod illustrated by FIG. 7 and might comprise one or more timercircuits as discussed above with respect to FIG. 7. Control circuitry870 might further be configured to manage access to physical addressesin the memory array, such as by blocking one or more logical addressesand to maintain a logical to physical address translation datastructure, for example. Control circuitry 870 might comprise one or moretimer circuits as discussed above with respect to FIG. 7.

Control circuitry 870 might be coupled (not shown in FIG. 8) to one ormore of the elements of the memory device 800. For example, the controlcircuitry might be coupled to the row decoder 844 and configured tocause the row decoder driver circuitry to bias particular word lines ofthe memory array 830. Control circuitry 870 might be coupled (not shownin FIG. 8) to and configured to cause the sense/data cache circuitry 848to bias particular bit lines of the array 830. Control circuitry 870might further comprise one or more register circuits. In one or moreembodiments, control circuitry 870 and/or firmware or other circuitrycan individually, in combination, or in combination with other elements,form an internal controller. As used herein, however, a controller neednot necessarily include any or all of such components. In someembodiments, a controller can comprise an internal controller (e.g.,located on the same die as the memory array) and/or an externalcontroller. In at least one embodiment, the control circuitry 870 mayutilize a state machine.

Control signals and commands can be sent (e.g., transferred) by theprocessor 810 to the memory device 800 over a command bus 872. Thecommand bus 872 may be a discrete signal line or may be comprised ofmultiple signal lines, for example. The commands sent over the commandsignal lines 872 are used to control the operations on the memory array830, including performing data read, data write (e.g., program), anderase operations. The command bus 872 and I/O bus 862 may be combined ormay be combined in part to form a number of standard interfaces (e.g.,communications interfaces) 878. For example, the interface 878 betweenthe memory device 800 and the processor 810 might be a Universal SerialBus (USB) interface. The interface 878 might also be a standardinterface used with many hard disk drives (e.g., SATA, PATA) as areknown to those skilled in the art.

The electronic system illustrated in FIG. 8 has been simplified tofacilitate a basic understanding of the features of the memory and isfor purposes of illustration only. A more detailed understanding ofinternal circuitry and functions of non-volatile memories are known tothose skilled in the art.

CONCLUSION

Multiple segment operations and non-volatile state trackers in memorydevices have been described. In particular, methods of operating memorydevices by segmenting operations and providing non-volatile statetrackers corresponding to segmented operations have been discussed.Memory device operations might be managed by segmenting operations andperforming such segmented operations along with other operations withinthe memory device to avoid violating specific timing requirements of thememory devices.

Although specific embodiments have been illustrated and describedherein, it will be appreciated by those of ordinary skill in the artthat any arrangement, which is calculated to achieve the same purpose,may be substituted for the specific embodiments shown. Many adaptationsof the disclosure will be apparent to those of ordinary skill in theart. Accordingly, this application is intended to cover any adaptationsor variations of the disclosure.

What is claimed is:
 1. A method of operating a memory device, the methodcomprising: performing a first memory operation having an associatedtiming requirement; after completing the first memory operation,determining whether a timing margin between completion of the firstmemory operation and expiration of its associated timing requirementexceeds a length of time to perform a particular portion of a secondmemory operation; and performing the particular portion of the secondmemory operation between completion of the first memory operation andthe expiration of its associated timing requirement if it is determinedthat the timing margin between completion of the first memory operationand expiration of its associated timing requirement exceeds the lengthof time to perform the particular portion of the second memoryoperation.
 2. The method of claim 1, wherein performing the first memoryoperation is in response to a command received by the memory device. 3.The method of claim 2, wherein performing the particular portion of thesecond memory operation comprises performing a portion of a backgroundoperation.
 4. The method of claim 2, wherein performing the particularportion of the second memory operation comprises initiating theparticular portion of the second memory operation by an internalcontroller of the memory device.
 5. The method of claim 4, whereinperforming the particular portion of the second memory operationcomprises performing the particular portion of the second memoryoperation hidden from any external controller connected to the memorydevice.
 6. The method of claim 1, wherein performing the first memoryoperation comprises performing the first memory operation as part of areset sequence of the memory device.
 7. The method of claim 1, furthercomprising: storing an indication that the particular portion of thesecond memory operation has been performed after completion of theparticular portion of the second memory operation.
 8. The method ofclaim 1, further comprising: performing a third memory operation havingan associated timing requirement; after completing the third memoryoperation, determining whether a timing margin between completion of thethird memory operation and expiration of its associated timingrequirement exceeds a length of time to perform a different portion ofthe second memory operation; and performing the different portion of thesecond memory operation between completion of the third memory operationand the expiration of its associated timing requirement if it isdetermined that the timing margin between completion of the third memoryoperation and expiration of its associated timing requirement exceedsthe length of time to perform the particular portion of the secondmemory operation.
 9. The method of claim 8, wherein performing the thirdmemory operation is in response to a command received by the memorydevice.
 10. The method of claim 8, further comprising: storing anindication that the particular portion of the second memory operationhas been performed after completion of the particular portion of thesecond memory operation; and storing an indication that the differentportion of the second memory operation has been performed aftercompletion of the different portion of the second memory operation. 11.The method of claim 1, further comprising: after completing theparticular portion of the second memory operation, determining whether atiming margin between completion of the particular portion of the secondmemory operation and the expiration of the associated timing requirementof the first memory operation exceeds a length of time to perform adifferent portion of the second memory operation; and performing thedifferent portion of the second memory operation between completion ofthe particular portion of the second memory operation and the expirationof the associated timing requirement of the first memory operation if itis determined that the timing margin between completion of theparticular portion of the second memory operation and the expiration ofthe associated timing requirement of the first memory operation exceedsthe length of time to perform the different portion of the second memoryoperation.
 12. A method of operating a memory device, the methodcomprising: performing a first memory operation having an associatedtiming requirement; after completing the first memory operation,determining whether a timing margin between completion of the firstmemory operation and expiration of its associated timing requirementexceeds a length of time to perform a portion of a second memoryoperation; performing the portion of the second memory operation betweencompletion of the first memory operation and the expiration of itsassociated timing requirement if it is determined that the timing marginbetween completion of the first memory operation and expiration of itsassociated timing requirement exceeds the length of time to perform theportion of the second memory operation; and for one or more additionalportions of the second memory operation: determining whether a timingmargin between completion of the preceding portion of the second memoryoperation and expiration of the associated timing requirement of thefirst memory operation exceeds a length of time to perform a nextportion of the second memory operation; and performing the next portionof the second memory operation between completion of the precedingportion of the second memory operation and expiration of the associatedtiming requirement of the first memory operation if it is determinedthat the timing margin between completion of the preceding portion ofthe second memory operation and expiration of the associated timingrequirement of the first memory operation exceeds the length of time toperform the next portion of the second memory operation.
 13. The methodof claim 12, further comprising: after expiration of the associatedtiming requirement of the first memory operation, performing a thirdmemory operation having an associated timing requirement; aftercompleting the third memory operation, determining whether a timingmargin between completion of the third memory operation and expirationof its associated timing requirement exceeds a length of time to performa next subsequent portion of the second memory operation; and performingthe next subsequent portion of the second memory operation betweencompletion of the third memory operation and the expiration of itsassociated timing requirement if it is determined that the timing marginbetween completion of the third memory operation and expiration of itsassociated timing requirement exceeds the length of time to perform thenext subsequent portion of the second memory operation.
 14. The methodof claim 13, further comprising: determining a status of the portions ofthe second memory operation to determine the next subsequent portion ofthe second memory operation.
 15. The method of claim 14, whereindetermining the status of the portions of the second memory operationcomprises reading a non-volatile storage location of the memory storingdata indicative of a status of each portion of the second memoryoperation.
 16. The method of claim 15, further comprising: updating thenon-volatile storage location after performing each portion of thesecond memory operation.
 17. The method of claim 13, further comprising:for one or more additional portions of the second memory operation:determining whether a timing margin between completion of the precedingportion of the second memory operation and expiration of the associatedtiming requirement of the third memory operation exceeds a length oftime to perform a next portion of the second memory operation; andperforming the next portion of the second memory operation betweencompletion of the preceding portion of the second memory operation andexpiration of the associated timing requirement of the third memoryoperation if it is determined that the timing margin between completionof the preceding portion of the second memory operation and expirationof the associated timing requirement of the third memory operationexceeds the length of time to perform the next portion of the secondmemory operation.
 18. A method of operating a memory device, the methodcomprising: performing a first memory operation having an associatedtiming requirement; after completing the first memory operation,determining whether a timing margin between completion of the firstmemory operation and expiration of its associated timing requirementexceeds a length of time to perform one or more portions of a secondmemory operation; performing the one or more portions of the secondmemory operation between completion of the first memory operation andthe expiration of its associated timing requirement if it is determinedthat the timing margin between completion of the first memory operationand expiration of its associated timing requirement exceeds the lengthof time to perform the one or more portions of the second memoryoperation; after expiration of the associated timing requirement of thefirst memory operation, performing a third memory operation having anassociated timing requirement; after completing the third memoryoperation, determining whether a timing margin between completion of thethird memory operation and expiration of its associated timingrequirement exceeds a length of time to perform one or more otherportions of the second memory operation; and performing the one or moreother portions of the second memory operation between completion of thethird memory operation and the expiration of its associated timingrequirement if it is determined that the timing margin betweencompletion of the third memory operation and expiration of itsassociated timing requirement exceeds the length of time to perform theone or more other portions of the second memory operation.
 19. Themethod of claim 18, further comprising: determining a status of theportions of the second memory operation prior to performing each of theportions of the second memory operation; and updating the status of theportions of the second memory operation after performing each of theportions of the second memory operation.
 20. The method of claim 18,wherein the associated timing requirement of the first memory operationis different than the associated timing requirement of the third memoryoperation.